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We offer a range of analysis techniques for characterizing materials properties

Structure and Chemistry

  • X-ray analysis, for crystallography, phase identification, texture mapping, Rietveld refinement and thickness measurements.
  • Atomic force microscopy (AFM), for surface morphology
  • Scanning electron microscopy (SEM), for surface imaging with nanometer resolution
  • X-ray photoelectron spectroscopy (XPS), for stoichiometry and chemical bonding
  • X-ray diffraction (XRD), for phase identification
  • Energy dispersive X-ray spectroscopy (SEM-EDX), for chemical mapping

Magnetism, Optics and Electrical transport

  • Vibrating sample magnetometry, for volume magnetization measurements
  • Magnetic force microscopy, for magnetic domain characterization
  • Magnetoresistance, for magneto-transport properties
  • Resistance, for resistivity and temperature coefficient of resistivity
  • Hall effect, for carrier concentration and mobility
  • Optical microscopy, for surface imaging
  • Ellipsometry, for absorption and refractive index