We offer a range of analysis techniques for characterizing materials properties
Structure and Chemistry
- X-ray analysis, for crystallography, phase identification, texture mapping, Rietveld refinement and thickness measurements.
- Atomic force microscopy (AFM), for surface morphology
- Scanning electron microscopy (SEM), for surface imaging with nanometer resolution
- X-ray photoelectron spectroscopy (XPS), for stoichiometry and chemical bonding
- X-ray diffraction (XRD), for phase identification
- Energy dispersive X-ray spectroscopy (SEM-EDX), for chemical mapping
Magnetism, Optics and Electrical transport
- Vibrating sample magnetometry, for volume magnetization measurements
- Magnetic force microscopy, for magnetic domain characterization
- Magnetoresistance, for magneto-transport properties
- Resistance, for resistivity and temperature coefficient of resistivity
- Hall effect, for carrier concentration and mobility
- Optical microscopy, for surface imaging
- Ellipsometry, for absorption and refractive index